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Information card for entry 7242916
Preview
| Coordinates | 7242916.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H38 S2 Si2 |
|---|---|
| Calculated formula | C28 H38 S2 Si2 |
| SMILES | c1(c2cccc(c2cs1)c1cccc2c(scc12)[Si](C)(C)C(C)(C)C)[Si](C)(C)C(C)(C)C |
| Title of publication | Synthesis, optical and electrochemical properties of 4,4′-bibenzo[c]thiophene derivatives |
| Authors of publication | Obayashi, Kotaro; Imato, Keiichi; Aoyama, Satoshi; Enoki, Toshiaki; Akiyama, Seiji; Ishida, Mio; Suga, Seiji; Mitsudo, Koichi; Ooyama, Yousuke |
| Journal of publication | RSC Advances |
| Year of publication | 2021 |
| Journal volume | 11 |
| Journal issue | 31 |
| Pages of publication | 18870 - 18880 |
| a | 17.6427 ± 0.0009 Å |
| b | 11.2395 ± 0.0006 Å |
| c | 14.1794 ± 0.0007 Å |
| α | 90° |
| β | 95.121 ± 0.001° |
| γ | 90° |
| Cell volume | 2800.5 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0343 |
| Residual factor for significantly intense reflections | 0.0292 |
| Weighted residual factors for significantly intense reflections | 0.0711 |
| Weighted residual factors for all reflections included in the refinement | 0.0743 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.955 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 265497 (current) | 2021-05-26 | cif/ Adding structures of 7242916, 7242917 via cif-deposit CGI script. |
7242916.cif |
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Users of the data should acknowledge the original authors of the
structural data.